Bohm trajectories for the modeling of tunneling devices

被引:0
|
作者
Sune, J [1 ]
Oriols, X [1 ]
GarciaGarcia, JJ [1 ]
Martin, F [1 ]
Gonzalez, T [1 ]
Mateos, J [1 ]
Pardo, D [1 ]
机构
[1] Univ Salamanca, E-37008 Salamanca, SPAIN
关键词
Computer simulation - Current voltage characteristics - Electron scattering - Electron tunneling - Monte Carlo methods - Quantum theory - Semiconductor device models - Tunnel diodes;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is shown that quantum phenomena in electron devices, such as tunneling of electrons, can be modeled using Bohm trajectories. Fowler-Nordheim tunneling in thin-oxide MOS structures and resonant tunneling in double barrier diodes are considered.
引用
收藏
页码:125 / 128
页数:4
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