Characterization of fractional order for high-frequency bandwidth model of dielectric ferroelectrics

被引:8
|
作者
Zhang, Bin [1 ]
Ducharne, Benjamin [2 ]
Sebald, Gael [2 ]
Guyomar, Daniel [2 ]
机构
[1] Shandong Univ, Res Ctr Mech & Mechatron Equipment, Weihai 264209, Peoples R China
[2] INSA Lyon, Lab Genie Elect & Ferroelect, Villeurbanne, France
关键词
Piezoelectric; model; fractional operator; losses; hysteresis; high frequency; HYSTERESIS MODEL; ELECTRIC-FIELD; POLARIZATION; TRANSISTOR; SIMULATION; INSULATOR; CERAMICS;
D O I
10.1177/1045389X14563866
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Fractional operators are particularly well adapted for modeling dielectric losses of a ferroelectric material. Common integer derivative operators are generally limited to a relatively weak frequency bandwidth, whereas an approach based on fractional derivatives gives rise to good accuracy between measured hysteresis and simulated loops beyond the frequency bandwidth of classical piezoelectric systems. This article demonstrates the relation between the fractional operator used for the modeling of hysteresis plots (high electric field amplitude, relatively low frequency) and the fractional behavior of a ceramic characterized by the frequency analyzer characterization (low electric field amplitude but high frequency) bandwidth measurements obtained using impedance spectroscopy. In both cases, it was concluded that the dynamic losses had the same physical origin and could consequently be modeled using the same operator and parameters. This notion is particularly interesting as it enables to limit the piezoceramic characterization to the impedance analyzer and to anticipate the high-level excitation behavior in simulation. Finally, it confirms that the fractional operator provides a good view of the dynamic behavior and broadens its domain application to the dynamic variation of the well-known piezoelectric coefficients.
引用
收藏
页码:437 / 443
页数:7
相关论文
共 50 条
  • [21] HIGH-FREQUENCY DIELECTRIC CONSTANT OF A PLASMA
    SILIN, VP
    SOVIET PHYSICS JETP-USSR, 1962, 14 (03): : 617 - 622
  • [22] Characterization of Low Loss Dielectric Materials for High-Speed and High-Frequency Applications
    Lee, Tzu-Nien
    Lau, John-H
    Ko, Cheng-Ta
    Xia, Tim
    Lin, Eagle
    Yang, Kai-Ming
    Lin, Puru-Bruce
    Peng, Chia-Yu
    Chang, Leo
    Chen, Jia-Shiang
    Fang, Yi-Hsiu
    Liao, Li-Yueh
    Charn, Edward
    Wang, Jason
    Tseng, Tzyy-Jang
    IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022), 2022, : 2222 - 2229
  • [23] Round-Trip Sensitivity-Bandwidth Optimization and Characterization of High-Frequency PMUTs
    He, Leming
    Lv, Ning
    Xu, Weijiang
    Wang, Yan
    Ren, Junyan
    2023 IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, ISAF, 2023,
  • [24] Reliable High-Frequency Fabricated Fractional-Order Capacitors and Their Passive Circuit Models
    Kartci, Aslihan
    Herencsar, Norbert
    Salama, Khaled Nabil
    2020 28TH SIGNAL PROCESSING AND COMMUNICATIONS APPLICATIONS CONFERENCE (SIU), 2020,
  • [25] Complex-Order Fractional Proportional-Resonant Controller for High-Frequency Applications
    Heredero-Peris, Daniel
    Capo-Lliteras, Macia
    Montesinos-Miracle, Daniel
    Melendez-Frigola, Joaquim
    IEEE OPEN JOURNAL OF THE INDUSTRIAL ELECTRONICS SOCIETY, 2025, 6 : 43 - 61
  • [26] High-frequency acoustic communications achieving high bandwidth efficiency
    Song, H. C.
    Hodgkiss, W. S.
    Kuperman, W. A.
    Akal, T.
    Stevenson, M.
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 2009, 126 (02): : 561 - 563
  • [27] High frequency dielectric spectroscopy of relaxor ferroelectrics and related materials
    Bovtun, V
    Petzelt, J
    Kamba, S
    Porokhonskyy, V
    Pashkin, A
    Veljko, S
    Samoukhina, P
    Yakimenko, Y
    MSMW'04: FIFTH INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER, AND SUBMILLIMETER WAVES, SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2, 2004, : 757 - 759
  • [28] Fork-coupled resonators for high-frequency characterization of dielectric substrate materials
    Muqaibel, Ali Hussein
    Safaai-Jazi, Ahmad
    Riad, Sedki M.
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2006, 55 (06) : 2216 - 2220
  • [29] Dielectric Characterization for Secure and Reliable High-Frequency Printed Circuit Board Applications
    1600, Institute of Electrical and Electronics Engineers Inc.
  • [30] HIGH-FREQUENCY DEFECT CHARACTERIZATION
    KHURIYAKUB, BT
    KINO, GS
    IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1978, 25 (04): : 249 - 249