A solution of correspondence problem for measuring 3D surface

被引:0
|
作者
Chen, YS [1 ]
Chen, BT [1 ]
机构
[1] Yuan Ze Univ, Dept Elect Engn, Chungli 320, Taiwan
关键词
D O I
暂无
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
This paper deals with the correspondence problem of two grabbed images, obtained by projecting a structured light on the measuring surface, when 3D information of a given surface is needed. In our system, the constraint that codifies the pattern projected on the surface has been simplified by using a random speckle pattern, thus the correspondence problem is reduced to the local matching between two grabbed images and solved by a spatial distance computation technique. Experiments have shown the feasibility of the proposed method.
引用
收藏
页码:3553 / 3556
页数:4
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