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- [35] TEM Dark-Field Off-Axis Electron Holography Strain Measurement on Embedded-SiGe pMOSFETs and Comparison with Nano-Beam Diffraction Strain Measurement 2012 19TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2012,
- [39] Assessment of off-axis and in-line electron holography for measurement of potential variations in Cu(In, Ga)Se-2 thin-film solar cells ADVANCED STRUCTURAL AND CHEMICAL IMAGING, 2016, 2