Characterization of Profiled LiNbO3 and SBN Crystals by X-ray Diffraction

被引：0
|
作者：
Ivleva, Liudmila [1 ]
Voronov, V. [1 ]
Samoylovitch, M. [2 ]
机构：
[1] Russian Acad Sci, Gen Phys Inst, Moscow, Russia
[2] Technomash, Moscow, Russia
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2005年 / 61卷
关键词：
Stepanov technique; X-ray topography; crystal defects;
D O I：
10.1107/S0108767305081432
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P.16.04.6
引用
收藏
页码：C441 / C442
页数：2
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