Application of high refractive index fluid to KrF-immersion lithography

被引:0
|
作者
Yada, Yuji
Ito, Koji
Yamaguchi, Yoshikazu
Furukawa, Taiichi
Miyamatsu, Takashi
Wang, Yong
Hieda, Katsuhiko
Shimokawa, Tsutomu
机构
关键词
KrF immersion lithography; high refractive index immersion fluid; photoresist; optical characteristic; leaching; lithographic performance;
D O I
10.1117/12.655983
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper describes the material characteristics for KrF-immersion lithography with a high refractive index fluid. We have obtained promising results in soaking experiments involving KrF lithography without topcoat film. Although water is currently used as the immersion fluid in 193nm lithography, providing suitable refractive index (n=1.44@193nm and n=1.37@248nm) and transmittance (> 99%/mm), it is found to have leaching issues when used with KrF resist. On the other hand, our high refractive index fluid (JSR-HIL-001), which was developed for ArF immersion purposes, satisfies the following requirements: HIL-001 has indicated promising characteristics as a 248nm-immmersion fluid. The refractive index is 1.54@248nm and the transmittance is > 99%/mm. In this paper the physical and chemical properties of HIL-001 for KrF-immersion fluid application are discussed in detail.
引用
收藏
页码:U725 / U733
页数:9
相关论文
共 50 条
  • [21] New high index fluids for immersion lithography
    Costner, Elizabeth
    Taylor, J. Christopher
    Caporale, Stefan
    Wojtczak, William
    Dewulf, Dean
    Conley, Will
    Willson, C. Grant
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXIII, PTS 1 AND 2, 2006, 6153 : U220 - U230
  • [22] High index resists for 193 nm immersion lithography
    Matsumoto, Kazuya
    Costner, Elizabeth
    Nishimura, Isao
    Ueda, Mitsuru
    Willson, C. Grant
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXV, PTS 1 AND 2, 2008, 6923
  • [23] Current status of High index Immersion Lithography development
    Ohmura, Yasuhiro
    Nakashima, Toshiharu
    Nagasaka, Hiroyuki
    Sukegawa, Ayako
    Ishiyama, Satoshi
    Kamijo, Koichi
    Shinkai, Masahiko
    Owa, Soichi
    OPTICAL MICROLITHOGRAPHY XX, PTS 1-3, 2007, 6520
  • [24] High index resist for 193 nm immersion lithography
    Matsumoto, Kazuya
    Costner, Elizabeth A.
    Nishimura, Isao
    Ueda, Mitsuru
    Willson, C. Grant
    MACROMOLECULES, 2008, 41 (15) : 5674 - 5680
  • [25] Synthesis of high refractive index sulfur containing polymers for 193nm immersion lithography; A progress report
    Blakey, Idriss
    Conley, Will
    George, Graeme A.
    Hill, David J. T.
    Liu, Heping
    Rasoul, Firas
    Whittaker, Andrew K.
    ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXIII, PTS 1 AND 2, 2006, 6153 : U272 - U281
  • [26] Study on Imaging Characterization of ArF High Index Immersion Lithography
    Park, Sarohan
    Park, Jun-Taek
    Lee, Kilyoung
    Eom, Tae-Seung
    Kim, Jin-Soo
    Kim, Hyeong-Soo
    Moon, Seung-Chan
    LITHOGRAPHY ASIA 2008, 2008, 7140
  • [27] High-index materials for 193 nm immersion lithography
    Burnett, JH
    Kaplan, SG
    Shirley, EL
    Tompkins, PJ
    Webb, JE
    OPTICAL MICROLITHOGRAPHY XVIII, PTS 1-3, 2005, 5754 : 611 - 621
  • [28] Application of ellipsometry in immersion lithography
    Jeong, H.
    Cheon, H.
    Kyoung, J.
    Oh, H.
    An, I.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, 2008, 5 (05): : 1414 - 1418
  • [29] High refractive-index resists composed of anionic photoacid generator (PAG) bound polymers for 193 nm immersion lithography
    Gonsalves, Kenneth E.
    Wang, Mingxing
    Pujari, Narahari S.
    ADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXV, PTS 1 AND 2, 2008, 6923
  • [30] High-Index fluoride materials for 193 nm immersion lithography
    Nawata, Teruhiko
    Inui, Yoji
    Masada, Isao
    Nishijima, Eiichi
    Mabuchi, Toshiro
    Mochizuki, Naoto
    Satoh, Hiroki
    Fukuda, Tsuguo
    OPTICAL MICROLITHOGRAPHY XX, PTS 1-3, 2007, 6520