Coupling X-ray scattering and nitrogen adsorption: An interesting approach for the characterization of ordered mesoporous materials. Application to hexagonal silica

被引:66
|
作者
Albouy, PA
Ayral, A
机构
[1] Univ Paris 11, UMR CNRS 8502, Phys Solides Lab, F-91405 Orsay, France
[2] Univ Montpellier 2, UMR CNRS 5635, Inst Europeen Membranes, F-34095 Montpellier 5, France
关键词
D O I
10.1021/cm0211453
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The structural evolution of a D hexagonal mesoporous silica powder during nitrogen adsorption at low temperature is followed by X-ray diffraction. The values for the pore radius and wall microporosity obtained with this technique compare well to the estimations drawn from volumetric measurements. It is further shown that capillary condensation is not accompanied by material shrinkage; on the contrary, a slight increase in the unit cell parameter is observed. A comparison of the diffracted intensity before gas adsorption and after capillary condensation allows the silica skeleton density to be estimated precisely. In the intermediate situation, intensity calculations are performed in the frame of a conventional model of a nitrogen film condensed on the mesopore walls; estimates of the film thickness are in good agreement with predictions. It is further possible to separate the evolution of the nitrogen content of the micro- and mesopores.
引用
收藏
页码:3391 / 3397
页数:7
相关论文
共 50 条
  • [31] Low-angle X-ray scattering for the determination of the size of mesoporous silica nanoparticles
    Yassin, Fatma M.
    Fathy, Mohamed M.
    Fahmy, Heba M.
    Elshemey, Wael M.
    RADIATION PHYSICS AND CHEMISTRY, 2021, 179
  • [32] Mesoporous dendrimer silica monoliths studied by small-angle X-ray scattering
    Weinberger, Manuel
    Puchegger, Stephan
    Rentenberger, Christian
    Puchberger, Michael
    Huesing, Nicola
    Peterlik, Herwig
    JOURNAL OF MATERIALS CHEMISTRY, 2008, 18 (40) : 4783 - 4789
  • [33] Residual strain in thermally annealed periodic mesoporous silica revealed by x-ray scattering
    Chen, G.
    Wan, C.
    APPLIED PHYSICS LETTERS, 2010, 96 (14)
  • [34] Mesoporous Hydrogels: Revealing Reversible Porosity by Cryoporometry, X-ray Scattering, and Gas Adsorption
    Weber, Jens
    Bergstroem, Lennart
    LANGMUIR, 2010, 26 (12) : 10158 - 10164
  • [35] Studies of intrawall porosity in the hexagonally ordered mesostructures of SBA-15 by small angle X-ray scattering and nitrogen adsorption
    Pikus, Stanislaw
    Celer, Ewa B.
    Jaroniec, Mietek
    Solovyov, Leonid A.
    Kozak, Maciej
    APPLIED SURFACE SCIENCE, 2010, 256 (17) : 5311 - 5315
  • [36] Observation on the Structure of Ordered Mesoporous Materials at High Temperature via in situ X-ray Diffraction
    Zhou, Chun Fang
    Zhu, Jian Hua
    ADVANCES IN NEW CATALYTIC MATERIALS, 2010, 132 : 29 - 37
  • [37] High resolution X-ray scattering methods for ULSI materials characterization
    Matyi, RJ
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 2003, 683 : 634 - 645
  • [38] Mechanical stability of pure silica mesoporous MCM-41 by nitrogen adsorption and small-angle X-ray diffraction measurements
    Gusev, VY
    Feng, XB
    Bu, Z
    Haller, GL
    OBrien, JA
    JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (06): : 1985 - 1988
  • [39] Characterization of ordered mesoporous films on silicon (001) surface using X-ray and electron diffraction
    Liu, PH
    Chao, KJ
    Guo, XJ
    Huang, KY
    Lee, YR
    Cheng, CW
    Chiu, MS
    Chang, SL
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2005, 38 : 211 - 216
  • [40] In situ synchrotron small-angle X-ray scattering/X-ray diffraction study of the formation of SBA-15 mesoporous silica
    Flodström, K
    Teixeira, CV
    Amenitsch, H
    Alfredsson, V
    Lindén, M
    LANGMUIR, 2004, 20 (12) : 4885 - 4891