Simplified front surface field formation for back contacted silicon solar cells

被引:10
|
作者
Kimmerle, Achim [1 ]
Woehl, Robert [1 ]
Wolf, Andreas [1 ]
Biro, Daniel [1 ]
机构
[1] Fraunhofer Inst Solar Energy Syst ISE, D-79110 Freiburg, Germany
关键词
doping; phosphorus-diffusion; back-contact; back-junction; front-surface field;
D O I
10.1016/j.egypro.2013.07.278
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We investigate the formation of deep Phosphorus diffusion profiles with low surface concentrations in one single diffusion step. Such processes are suited for front surface field formation for n-type back-contact back-junction (BC-BJ) silicon solar cells or p-type silicon solar cells with alternative metallization techniques. The deposition temperature allows accurate control of the sheet resistance whereas the temperature of the in-situ oxidation strongly influences the profile-depth and surface concentration. The newly developed process leads to low dark saturation current densities well below 30 fA/cm(2) on alkaline-textured surfaces and low short circuit current loss at the front side. Due to their depth and adjustable surface concentration, the obtained profiles are promising for front-surfacefields (FSF) and novel n-type emitters. A first implementation in BC-BJ solar cells with aluminum-alloyed emitter shows a good blue response of the solar cells and an improved efficiency compared to the reference process by 0.6 %(abs). (C) 2013 The Authors. Published by Elsevier Ltd.
引用
收藏
页码:278 / 282
页数:5
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