Single-crystal diamond pyramids: synthesis and application for atomic force microscopy

被引:13
|
作者
Tuyakova, Feruza T. [1 ,2 ]
Obraztsova, Ekaterina A. [3 ,4 ,5 ]
Ismagilov, Rinat R. [6 ]
机构
[1] Univ Eastern Finland, Dept Math & Phys, POB 111, Joensuu 80101, Finland
[2] Moscow State Inst Radio Engn Elect & Automat, Vernadsky Prospect 78, Moscow 119454, Russia
[3] Russian Acad Sci, MM Shemyakin & Yu A Ovchinnikov Inst Bioorgan Che, Str Miklukho Maklaya 16-10, Moscow 117997, Russia
[4] Russian Acad Sci, AM Prokhorov Gen Phys Inst, Str Vavilova 38, Moscow 119991, Russia
[5] Natl Univ Sci & Technol MISIS, Leninsky Prospekt 4, Moscow 119049, Russia
[6] Moscow MV Lomonosov State Univ, Dept Phys, Leninskie Gory 1-2, Moscow 119991, Russia
关键词
atomic force microscopy; diamond; chemical vapor deposition; DIP-PEN NANOLITHOGRAPHY; RESOLUTION; PROBES;
D O I
10.1117/1.JNP.10.012517
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Here we present the results of investigations aimed at the development and testing of robust, chemically inert single-crystal diamond probes for atomic force microscopy (AFM). The probes were prepared by assembling common silicon probes with micrometer-sized pyramid-shaped single-crystal diamonds (SCD). The SCD were obtained by the selective thermal oxidation of the polycrystalline films grown by chemical vapor deposition. Electrostatic spray of adhesive coating onto silicon probes was used to attach individual SCD. Geometrical parameters of produced AFM SCD probes were revealed with transmission electron microscopy: the apex angle of the pyramidal diamond crystallite was similar to 10 deg, and the curvature radius at the apex was similar to 2 to 10 nm. The diamond AFM probes were used for surface imaging of deoxyribonucleic acid deposited on graphite substrate. Obtained results demonstrate high efficiency of the diamond AFM probes, allowing improvement of the image quality compared to standard silicon probes. (C) 2015 Society of Photo-Optical Instrumentation Engineers (SPIE)
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页数:8
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