The source issue in infrared microspectroscopy

被引:17
|
作者
Smith, TI [1 ]
机构
[1] Stanford Univ, WW Hansen Expt Phys Lab, Stanford, CA 94305 USA
关键词
infrared; spectroscopy; microscopy; synchrotron radiation; free-electron laser;
D O I
10.1016/S0168-9002(02)00383-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Infrared spectroscopy using a Fourier Transform Infrared (FTIR) spectrometer is routine. These instruments are sophisticated and mature, and generally use a blackbody radiator as their infrared source. However, because the brightness of a thermal source is limited, the signal-to-noise ratio of these instruments begins to degrade at spatial resolutions not much better than I mm and they are rarely useful at resolutions smaller than 20 pm. Synchrotrons provide much brighter infrared beams than thermal sources, and Free-Electron Lasers (FELs) provide even brighter beams than synchrotrons. We will discuss the limitations of thermal sources, and show that a synchrotron is an excellent source for infrared spectroscopy at spatial resolutions on the order of the wavelength (). Even better spatial resolution, about lambda/10, can be expected if an FEL is used as a source. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:565 / 570
页数:6
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