Probing the magnetization reversal of micro structured permalloy cross by planar Hall measurement and magnetic force microscopy

被引：4
|
作者：
Chang, Y. C. [1 ]
Chang, C. C.
Wu, J. C.
Wei, Z. H.
Lai, M. F.
Chang, C. R.
机构：
[1] Natl Changhua Univ Educ, Changhua 500, Taiwan
[2] Natl Tsing Hua Univ, Hsinchu 30013, Taiwan
[3] Natl Taiwan Univ, Taipei 106, Taiwan
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2006年 / 42卷 / 10期
关键词：
Hall effect devices; magnetic force microscopy (MFM); magnetic recording; magnetoresistance;
D O I：
10.1109/TMAG.2006.878421
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration.
引用
收藏
页码：2963 / 2965
页数：3
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