In-Line Plasma-Chemical Etching of Crystalline Silicon Solar Wafers at Atmospheric Pressure

被引:6
|
作者
Linaschke, Dorit [1 ]
Leistner, Matthias [1 ]
Grabau, Patrick [1 ]
Maeder, Gerrit [1 ]
Graehlert, Wulf [1 ]
Dani, Ines [1 ]
Kaskel, Stefan [1 ]
Beyer, Eckhard [2 ]
机构
[1] Fraunhofer Inst Mat & Beam Technol, Dept CVD Thin Film Technol, D-01277 Dresden, Germany
[2] Tech Univ Dresden, Inst Surface & Mfg Technol, D-01062 Dresden, Germany
关键词
Atmospheric pressure; DC arc plasma source; gas phase spectroscopy; plasma chemical etching;
D O I
10.1109/TPS.2009.2016425
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Atmospheric pressure plasma technologies are a potential substitution for wet chemical and vacuum processes in the production of crystalline silicon solar cells, leading to a simplified in-line processing chain. In this contribution, a plasma chemical etching technology is presented as a basic step for a future continuous production process. A linearly extended DC arc discharge is used for activation of the etching gases. An Ar-N(2) mixture is fed through the plasma source; etch gases are injected into the afterglow plasma, near the substrate. Controlled purge gas systems prevent the contamination of the reaction zone with air or moisture as well as the release of reaction products. The plasma source was studied by a noninvasive in-line monitoring of the DC arc phenomena. Silicon etching rates can be controlled by the etch gas composition and the plasma conditions. Fourier Transform infrared spectroscopy of the waste gas was applied to monitor the current etching rates. First industrial tests confirmed standard efficiencies of the cells after edge isolation by atmospheric pressure plasma etching.
引用
收藏
页码:979 / 984
页数:6
相关论文
共 50 条
  • [31] Study of Atmospheric Pressure Plasma Temperature Based on Silicon Carbide Etching
    Xu, Shaozhen
    Yuan, Julong
    Zhou, Jianxing
    Cheng, Kun
    Gan, Hezhong
    MICROMACHINES, 2023, 14 (05)
  • [32] In-Line Investigations of Atmospheric Pressure Plasma Processes in Correlation with Surface Analysis
    Guenther, Sandra
    Teuscher, Nico
    Heilmann, Andreas
    Haensel, Renate
    Voigt, Hans-Michael
    Kiesow, Andreas
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2011, 25 (08) : 857 - 868
  • [33] Radial junction solar cells prepared on single crystalline silicon wafers by metal-assisted etching
    Baytemir, Gulsen
    Es, Firat
    Alagoz, Arif Sinan
    Turan, Rasit
    PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2017, 11 (05):
  • [34] ANISOTROPIC PLASMA-CHEMICAL ETCHING BY AN ELECTRON-BEAM-GENERATED PLASMA
    VERHEY, TR
    ROCCA, JJ
    BOYER, PK
    JOURNAL OF APPLIED PHYSICS, 1988, 63 (07) : 2463 - 2466
  • [35] Plasma chemical etching of silicon
    Bogomolov, B. K.
    APEIE-2006 8TH INTERNATIONAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING PROCEEDINGS, VOL 1, 2006, : 38 - 39
  • [36] Beveling of silicon carbide wafer by plasma etching using atmospheric-pressure plasma
    Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
    不详
    Jpn. J. Appl. Phys., 8 PART 2
  • [37] Beveling of Silicon Carbide Wafer by Plasma Etching Using Atmospheric-Pressure Plasma
    Sano, Yasuhisa
    Kato, Takehiro
    Yamamura, Kazuya
    Mimura, Hidekazu
    Matsuyama, Satoshi
    Yamauchi, Kazuto
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, 49 (08)
  • [38] Low temperature plasma-chemical treatment of PdCl2 film by atmospheric pressure hydrogen plasma
    Koo, IG
    Lee, MS
    Lee, WM
    THIN SOLID FILMS, 2006, 506 : 350 - 354
  • [39] Hydrogen plasma etching technique for mono- and multi-crystal line silicon wafers
    Dhamrin, M.
    Ghazali, N. H.
    Jeon, M. S.
    Saitoh, T.
    Kamisako, K.
    CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2, 2006, : 1395 - +
  • [40] CONTAMINATION OF SILICON AND OXIDIZED SILICON WAFERS DURING PLASMA-ETCHING
    MURARKA, SP
    MOGAB, CJ
    JOURNAL OF ELECTRONIC MATERIALS, 1979, 8 (06) : 763 - 779