Reliability of Moore's Law - a measure of maintained quality

被引：0

作者：

Berezin, AA ^{[1
]}

Ibrahim, AM ^{[1
]}

机构：

[1] McMaster Univ, Hamilton, ON L8S 4L8, Canada

来源：

QUALITY, RELIABILITY, AND MAINTENANCE | 2004年

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An empirically deduced Moore's Law states that in the last fifty or so years the number of transistors on integrated circuits has doubled every 18 months. The paper discusses technological, social, economic and legal aspects of Moore's Law and argues that its future most likely will be influenced by the interaction of all these factors.

引用

页码：7 / 10

页数：4

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