Time-resolved x-ray diffraction measurement of C60 under high pressure and temperature using synchrotron radiation

被引：1
|
作者：
Horikawa, T [1 ]
Suito, K
Kobayashi, M
Onodera, A
机构：
[1] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan
[2] Univ Marketing & Distribut Sci, Nishi Ku, Kobe, Hyogo 6512188, Japan
来源：
JOURNAL OF PHYSICS-CONDENSED MATTER | 2002年 / 14卷 / 44期
关键词：
D O I：
10.1088/0953-8984/14/44/319
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
C-60 has been studied by means of time-resolved x-ray diffraction measurements using synchrotron radiation. Diffraction patterns were recorded at intervals of 1-10 min for samples under high pressure (12,5 and 14.3 GPa) and high temperature (up to 800degreesC) for, at the longest, 3 h. Time, pressure, and temperature dependences of the C-60 structure are presented and the relevance to the hardness of materials derived from C-60 is discussed.
引用
收藏
页码：10483 / 10486
页数：4
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