Time-resolved x-ray diffraction measurement of C60 under high pressure and temperature using synchrotron radiation

被引：1

作者：

Horikawa, T ^{[1
]}

Suito, K

Kobayashi, M

Onodera, A

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan

[2] Univ Marketing & Distribut Sci, Nishi Ku, Kobe, Hyogo 6512188, Japan

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2002年 / 14卷 / 44期

关键词：

D O I：

10.1088/0953-8984/14/44/319

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

C-60 has been studied by means of time-resolved x-ray diffraction measurements using synchrotron radiation. Diffraction patterns were recorded at intervals of 1-10 min for samples under high pressure (12,5 and 14.3 GPa) and high temperature (up to 800degreesC) for, at the longest, 3 h. Time, pressure, and temperature dependences of the C-60 structure are presented and the relevance to the hardness of materials derived from C-60 is discussed.

引用

页码：10483 / 10486

页数：4

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