New Circuit Topology for System-Level Reliability of GaN

被引：0

作者：

Lin, Ming-Cheng ^{[1
]}

Chang, Wen-Che ^{[1
]}

Wu, Haw-Yun ^{[1
]}

Lansbergen, Gabriel Petrus ^{[1
]}

Kwan, Man-Ho ^{[1
]}

Yu, Jiun-Lei ^{[1
]}

Wu, Cheng-Pao ^{[1
]}

Tsai, Chun-Lin ^{[1
]}

Tuan, Hsiao-Chin ^{[1
]}

Kalnitsky, Alex ^{[1
]}

机构：

[1] Taiwan Semicond Mfg Co, Analog Power & Specialty Technol Div, Hsinchu, Taiwan

来源：

2019 31ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD) | 2019年

关键词：

GaN; MTTF; System Lifetime;

D O I：

10.1109/ispsd.2019.8757683

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

To accelerate GaN adoption, beyond-JEDEC system-level reliability should be done to prove the robustness of GaN in applications. In this paper, a new hard switching test vehicle (half-bridge RC load) was proposed & demonstrated to achieve system-like stress, flexibility of acceleration test, low system power consumption with large sample size, easy setup & control which can meet system-level reliability requirement.

引用

页码：299 / 302

页数：4

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