Characterization of interphase regions using atomic force microscopy

被引：0
|
作者：
Vanlandingham, MR
McKnight, SH
Palmese, GR
Bogetti, TA
Eduljee, RF
Gillespie, JW
机构：
来源：
INTERFACIAL ENGINEERING FOR OPTIMIZED PROPERTIES | 1997年 / 458卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date,diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.
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页码：313 / 318
页数：6
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