Characterization of interphase regions using atomic force microscopy

被引：0
|
作者：
Vanlandingham, MR
McKnight, SH
Palmese, GR
Bogetti, TA
Eduljee, RF
Gillespie, JW
机构：
来源：
INTERFACIAL ENGINEERING FOR OPTIMIZED PROPERTIES | 1997年 / 458卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date,diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.
引用
收藏
页码：313 / 318
页数：6
相关论文
共 50 条
  • [1] Analysis of polymeric composite interphase regions with thermal atomic force microscopy
    Tillman, MS
    Hayes, BS
    Seferis, JC
    [J]. JOURNAL OF APPLIED POLYMER SCIENCE, 2001, 80 (10) : 1643 - 1649
  • [2] Analysis of polymeric composite interphase regions with thermal atomic force microscopy
    [J]. Seferis, J.C., 1600, (John Wiley and Sons Inc.):
  • [3] Using the Atomic Force Microscopy for nanocomposites local mechanical characterization: Towards the interphase measurement
    Lahoud-Dignat, N.
    Hidayatullah, M. N.
    Saysouk, F.
    Locatelli, M. L.
    Diaham, S.
    [J]. 2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD), VOLS 1-2, 2016, : 64 - 67
  • [4] Characterization of the interphase in epoxy/aluminum bonds using atomic force microscopy and a nano-indenter
    Williams, John G.
    Li, Fuping
    Miskioglu, Ibrahim
    [J]. Journal of Adhesion Science and Technology, 2005, 19 (3-5): : 257 - 277
  • [5] Characterization of the interphase in epoxy/aluminum bonds using atomic force microscopy and a nano-indenter
    Williams, JG
    Li, FP
    Miskioglu, I
    [J]. JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2005, 19 (3-5) : 257 - 277
  • [6] Characterization of heterogeneous regions in polymer systems using tapping mode and force mode atomic force microscopy
    Raghavan, D
    VanLandingham, M
    Gu, X
    Nguyen, T
    [J]. LANGMUIR, 2000, 16 (24) : 9448 - 9459
  • [7] Nanoscale characterization of the solid electrolyte interphase and lithium growth by atomic force microscopy
    He, Zixu
    Li, Wanxia
    Chen, Yawei
    Huang, Fanyang
    Jie, Yulin
    Li, Xinpeng
    Cao, Ruiguo
    Jiao, Shuhong
    [J]. BATTERY ENERGY, 2024, 3 (03):
  • [8] Characterization of nanoparticles using Atomic Force Microscopy
    Rao, A.
    Schoenenberger, M.
    Gnecco, E.
    Glatzel, Th
    Meyer, E.
    Braendlin, D.
    Scandella, L.
    [J]. PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 971 - 976
  • [9] Characterization of textiles using the atomic force microscopy
    Ye, H
    Wei, QF
    [J]. Proceedings of 2005 International Conference on Advanced Fibers and Polymer Materials (ICAFPM 2005), Vol 1 and 2: NEW CENTURY , NEW MATERIALS AND NEW LIFE, 2005, : 157 - 160
  • [10] Characterization of the relaxosome using atomic force microscopy
    Primer, Micaela
    McLaughlin, Krystle J.
    Donhauser, Zachary J.
    [J]. BIOPHYSICAL JOURNAL, 2024, 123 (03) : 475A - 475A
12345