Photoelectron Diffraction and Holography Studies of 2D Materials and Interfaces

被引:18
|
作者
Kuznetsov, Mikhail, V [1 ]
Ogorodnikov, Ilya I. [1 ]
Usachov, Dmitry Yu [2 ]
Laubschat, Clemens [3 ]
Vyalikh, Denis V. [2 ,4 ,5 ,6 ]
Matsui, Fumihiko [7 ]
Yashina, Lada, V [8 ]
机构
[1] Russian Acad Sci, Ural Branch, Inst Solid State Chem, Pervomayskaya Str 91, Ekaterinburg 620990, Russia
[2] St Petersburg State Univ, 7-9 Univ Skaya Nab, St Petersburg 199034, Russia
[3] Tech Univ Dresden, Inst Solid State Phys, D-01062 Dresden, Germany
[4] Dept Fis Mat, San Sebastian 20080, Spain
[5] Univ Basque Country, CFM MPC, DIPC, San Sebastian 20080, Spain
[6] Basque Fdn Sci, IKERBASQUE, Bilbao 48011, Spain
[7] Nara Inst Sci & Technol, Nara 6300192, Japan
[8] Moscow MV Lomonosov State Univ, Leninskie Gory 1-3, Moscow 199991, Russia
基金
俄罗斯基础研究基金会;
关键词
HEXAGONAL BORON-NITRIDE; ADSORBATE STRUCTURE DETERMINATION; LOCAL ATOMIC-STRUCTURE; MULTIPLE-SCATTERING; AUGER-ELECTRON; SURFACE-STRUCTURE; RAY; SPECTROSCOPY; GRAPHENE; LAYER;
D O I
10.7566/JPSJ.87.061005
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Photoelectron diffraction (XPD) and holography (XPH) are powerful spectroscopic methods that allow comprehensive exploration and characterization of certain structural properties of materials in particular those of 2D systems and interfaces. Recent developments in XPD and XPH are especially impressive when they are applied to partially disordered systems such as intercalation compounds, doped graphene, buffer layers or adsorbates and imperfectly ordered germanene and phoshporene. In our brief review, we sum up the advances in XPD and XPH studies of 2D materials and discuss the unique opportunities granted by these two interrelated methods.
引用
收藏
页数:12
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