Analysis of the residual spectrum in ADC dynamic testing

被引：1
|
作者：
Agrez, Dusan [1 ]
机构：
[1] Univ Ljubljana, Fac Elect Engn, Ljubljana 1001, Slovenia
来源：
2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5 | 2006年
关键词：
Analog-to-Digital Converter; spectrum analysis; DFT interpolation;
D O I：
10.1109/IMTC.2006.328339
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This paper presents a procedure that derives the estimation of the significant components in the residual spectrum in ADC dynamic testing. Die method for emulating coherent sampling by the interpolation of the DFT to estimate the frequency, amplitude, and phase of the particular residual component is described. Analysis has been made for the components below the level of the quantization resolution. The procedure of the threshold estimation for distinguishing between significant components and the noise floor is provided.
引用
收藏
页码：1033 / 1037
页数：5
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