Numerical electromagnetic analysis of transient induced voltages associated with lightning to tall structure

被引：7
|
作者：
Pokharel, RK
Baba, Y
Ishii, M
机构：
[1] Univ Tokyo, Tokyo, Japan
[2] Doshisha Univ, Kyoto 602, Japan
来源：
JOURNAL OF ELECTROSTATICS | 2004年 / 60卷 / 2-4期
关键词：
LEMP; lightning-induced voltage; numerical electromagnetic field analysis; return stroke; tall structure;
D O I：
10.1016/j.elstat.2004.01.019
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In the present paper, transient-induced voltages on a distribution line over finitely conducting ground, which are associated with lightning to a 200-m high stack, have been analyzed by Numerical Electromagnetics Code (NEC-2). An electromagnetic model (EM) of a lightning channel, which contains additional distributed inductance to simulate the reduced propagation velocity of lightning current, has been employed. Validity of the employed model which incorporates a tall Structure and a lightning channel has been discussed by comparing calculation with measurements. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：141 / 147
页数：7
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