Development of a high-strength high-conductivity Cu-Ni-P alloy. Part 1: Characterization of precipitation products

被引:23
|
作者
Murayama, M.
Belyakov, A.
Hara, T.
Sakai, Y.
Tsuzaki, K.
Okubo, M.
Eto, M.
Kimura, T.
机构
[1] Natl Inst Mat Sci, Steel Res Ctr, Tsukuba, Ibaraki 3050047, Japan
[2] Nippon Min & Met Co Ltd, Technol Dev Ctr, Hitachi, Ibaraki 3170056, Japan
关键词
Cu-Ni-P alloy; transmission electron microscopy (TEM); nickel phosphide; precipitation; age hardening; electro-conductivity;
D O I
10.1007/s11664-006-0158-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The precipitation products of a Cu-1.5Ni-0.32P (wt.%) alloy isochronally aged at 400 degrees C and 600 degrees C were investigated by transmission electron microscopy (TEM). There are two different sizes of precipitates formed in the 600 degrees C aged specimen. Large precipitates appear to be lath, the length of which varies from 100 nm to 500 nm, whereas small dotty contrasts around 10 nm in diameter are uniformly distributed in the matrix. Only small dotty contrasts are observed after 400 degrees C aging. In the composition range 0-33.3 at.%P, both the previous studies and the calculated Ni-P binary phase diagram indicated that the possible nickel phosphide phases are Ni3P, Ni12P5, Ni5P2, and Ni2P. However, selected area electron diffraction (SAED) pattern analysis in conjunction with energy dispersive x-ray spectroscopy (EDS) identified the large lath precipitates as Ni12P5 phase. On the other hand, the small precipitates could not be analyzed by EDS due to thinness; thus, the structure is estimated to be a Ni5P4 phase from the relationships between d-spacing and angles between planes measured from a selected area diffraction pattern.
引用
收藏
页码:1787 / 1792
页数:6
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