Lattice parameter determination by coincidental multi-beam X-ray diffraction

被引：4
|
作者：
Borcha, Mariana [1 ]
Fodchuk, Igor [1 ]
Krytsun, Igor [1 ]
机构：
[1] Chernivtsi Natl Univ, UA-58012 Chernovtsy, Ukraine
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2009年 / 206卷 / 08期
关键词：
MULTIPLE DIFFRACTION; SILICON; STRAIN;
D O I：
10.1002/pssa.200881617
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High-precision determination of the absolute value of lattice parameter for cubic single crystals is demonstrated by the example of silicon using coincidental multi-beam X-ray diffraction realized by superposition of two three-beam reflections at fixed sample temperature. Based on a semi-kinematical approximation of X-ray scattering theory, the algorithm for calculation of multi-beam diffractograms is developed enabling a more thorough quantitative analysis of experimental results. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码：1699 / 1703
页数：5
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