A special issue on the topic of Degradation, Damage, Fatigue and Accelerated Life Models in Reliability Testing Preface

被引：2
|
作者：
Escobar, Luis A. [1 ]
Guerin, Fabrice [2 ]
Meeker, William Q. [3 ]
Nikulin, Mikhail [4 ]
机构：
[1] Dept Expt Stat, Baton Rouge, LA 70816 USA
[2] Univ Angers, Inst Engn Sci & Technol, F-49000 Angers, France
[3] Iowa State Univ, Ames, IA 50011 USA
[4] Bordeaux Univ, Inst Math, F-33076 Bordeaux, France
来源：
JOURNAL OF STATISTICAL PLANNING AND INFERENCE | 2009年 / 139卷 / 05期
关键词：
D O I：
10.1016/j.jspi.2008.05.019
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
引用
收藏
页码：1576 / 1577
页数：2
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