A special issue on the topic of Degradation, Damage, Fatigue and Accelerated Life Models in Reliability Testing Preface

被引：2

作者：

Escobar, Luis A. ^{[1
]}

Guerin, Fabrice ^{[2
]}

Meeker, William Q. ^{[3
]}

Nikulin, Mikhail ^{[4
]}

机构：

[1] Dept Expt Stat, Baton Rouge, LA 70816 USA

[2] Univ Angers, Inst Engn Sci & Technol, F-49000 Angers, France

[3] Iowa State Univ, Ames, IA 50011 USA

[4] Bordeaux Univ, Inst Math, F-33076 Bordeaux, France

来源：

JOURNAL OF STATISTICAL PLANNING AND INFERENCE | 2009年 / 139卷 / 05期

关键词：

D O I：

10.1016/j.jspi.2008.05.019

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

引用

页码：1576 / 1577

页数：2

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