Structure of GaAs(001)-c(4 x 4): Comparison of X-ray diffraction and first-principles calculation

被引:1
|
作者
Takahasi, M.
Kratzer, P.
Penev, E.
Mizuki, J.
机构
[1] Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany
[2] Synchrotron Radiat Res Ctr, Japan Atom Energy Res Inst, Mikazuki, Hyogo 6795148, Japan
[3] Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany
[4] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
关键词
X-ray scattering; diffraction and reflection; growth; semiconductor; gallium arsenide;
D O I
10.1016/j.susc.2006.01.127
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The surface structure of GaAs(001)-c(4 x 4) was investigated by synchrotron surface X-ray diffraction which is sensitive to both in-plane and out-of-plane structures. The atomic coordinates and Debye-Waller factors for up to the sixth layer from the surface are given. The resultant atomic coordinates were compared with those given by a first-principles calculation. Among a variety of heterodimer models that were examined by theoretical calculation, our data fit best a three-heterodimer model where three Ga-As heterodimers are present in one unit cell. The preference for the formation of heterodimers is discussed in relationship to the transition process from the 2 x 4 to the c(4 x 4) structures. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:4099 / 4102
页数:4
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