Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

被引：26
|
作者：
Kageshima, M
Jensenius, H
Dienwiebel, M
Nakayama, Y
Tokumoto, H
Jarvis, SP
Oosterkamp, TH
机构：
[1] Joint Res Ctr Atom Technol, Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058562, Japan
[2] Leiden Univ, Leiden Inst Phys, NL-2333 CA Leiden, Netherlands
[3] Univ Osaka Prefecture, Dept Phys & Elect, Sakai, Osaka 5998531, Japan
来源：
APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 3-4期
关键词：
noncontact atomic force microscopy (NC-AFM); carbon nanotube (CNT); tuning fork; solvation shell; octamethylcyclotetrasiloxane (OMCTS);
D O I：
10.1016/S0169-4332(01)00975-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A force sensor for noncontact atomic force microscopy in liquid environment was developed by combining a multiwalled carbon nanotube (MWNT) probe with a quartz tuning fork. Solvation shells of octamethylcyclotetrasiloxane surface were detected both in the frequency shift and dissipation. Due to the high aspect ratio of the CNT probe, the long-range background force was barely detectable in the solvation region. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：440 / 444
页数：5
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