Polarized Backscattering From Spatially Anisotropic Rough Surface

This paper examines the polarized backscattering of spatially anisotropic rough surfaces. To better explore the physical mechanisms that control the azimuthal dependence of the backscattering from anisotropic surfaces, the effects of surface roughness [correlation length and root-mean-square (rms) height], dielectric constant, and radar parameters from anisotropic surfaces are studied. The advanced integral equation model (AIEM) is used to simulate both co-and cross-polarized backscattering coefficients, including the single and multiple scattering. Numerical results suggest that the multiple scattering exhibits a stronger azimuthal dependence for HH than VV polarization, especially more so at a larger incident angle. For weakly anisotropic surface, the azimuthal variation of backscattering tends to be a sinusoidal-like pattern. However, with the enhancement of anisotropy, such a scattering pattern is distorted, and the sharp dip appears at up/down direction. As the rms height and dielectric constant increase, the scattering is enhanced on the whole. The HH/VV ratio at lower dielectric constant is greater than that at higher one. In comparison, scattering shows stronger dependence on anisotropy at lower dielectric constant, especially at a larger incident angle. As an application example, we compare the model predictions with reported measurements from two different sites. Preliminary results are quite encouraging, and thus, the analysis presented in this paper is potentially useful to predict and interpret backscattering from crop field surface, where strong anisotropic surfaces commonly present due to plowing or raking practice.