Nitride-based laser diodes grown by plasma-assisted molecular beam epitaxy

被引:56
|
作者
Skierbiszewski, C. [1 ,2 ]
Turski, H. [1 ]
Muziol, G. [1 ]
Siekacz, M. [1 ,2 ]
Sawicka, M. [1 ,2 ]
Cywinski, G. [1 ]
Wasilewski, Z. R. [3 ]
Porowski, S. [1 ]
机构
[1] Polish Acad Sci, Inst High Pressure Phys, PL-01142 Warsaw, Poland
[2] TopGaN Ltd, PL-01142 Warsaw, Poland
[3] Univ Waterloo, Waterloo Inst Nanotechnol, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada
关键词
molecular beam epitaxy; nitrides; laser diodes; INGAN LASER; MAGNESIUM INCORPORATION; CRYSTAL-GROWTH; III-NITRIDES; GAN LAYERS; MBE-GROWTH; DEGRADATION; GAN(0001); INVERSION; GALLIUM;
D O I
10.1088/0022-3727/47/7/073001
中图分类号
O59 [应用物理学];
学科分类号
摘要
The progress in the growth of nitride-based laser diodes (LDs) made by plasma-assisted molecular beam epitaxy (PAMBE) is reviewed. In this work we describe the GaN and InGaN growth peculiarities, p-type doping efficiency, and the properties of InGaN quantum wells (QWs) grown by PAMBE. We demonstrate continuous wave (cw) LDs operating in the range from 410 to 482 nm. These LDs were grown on low dislocation (0 0 0 1) c-plane bulk GaN substrate, which allow one to fabricate cw LDs with a lifetime exceeding 2000 h. Also, the ultraviolet LDs at 388 nm grown on (2 0-2 1) semipolar substrates are discussed. The use of high active nitrogen fluxes up to 2 mu m/h during the InGaN growth was essential for pushing the lasing wavelengths of PAMBE LDs above 460 nm. Recent advancement of InGaN growth by PAMBE allows one to demonstrate high-quality quantum QWs and excellent morphology for thick layers. We discuss the influence of LDs design on their parameters such as lasing threshold current and laser beam quality.
引用
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页数:18
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