Machine-Learned Assessment and Prediction of Robust Solid State Storage System Reliability Physics

被引:0
|
作者
Sarkar, Jay [1 ]
Peterson, Cory [1 ]
Sanayei, Amir [1 ]
机构
[1] Western Digital Corp, 5601 Great Oaks Pkwy, San Jose, CA 95119 USA
关键词
SSD; Machine Learning; System Health; Storage; Analytics; Storage Health;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reliability physics of the complex memory sub-system of modern, robust solid state storage devices (SSDs) under throughput acceleration stress is analyzed leveraging Machine Learning - towards understanding their inherently designed fault-tolerance schemes that mitigate expected memory degradation mechanisms through reliable life as a system. With the strength of multiple designed error-management schemes effectively countering multiple memory degradation mechanisms under stress, the developed empirical data based Machine Learning framework allows inferential and predictive assessments on reliable SSD design at system-level in a quantitative and pro-active manner. Such Machine-Learned quantitative assessments on the system-level health of individual devices can be utilized towards managing qualification reliability assessments, assessing dynamic throughput stress impact on design and/or decision-making on reliability of individual and populations of solid-state storage systems.
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页数:8
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