Using neural networks to solve testing problems

被引：0
|
作者：
Kirkland, LV [1 ]
Wright, RG [1 ]
机构：
[1] USAF,OO ALC,TISAC,HILL AFB,UT 84056
来源：
AUTOTESTCON '96 - THE SYSTEM READINESS TECHNOLOGY CONFERENCE: TEST TECHNOLOGY AND COMMERCIALIZATION, CONFERENCE RECORD | 1996年
关键词：
D O I：
10.1109/AUTEST.1996.547716
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：298 / 302
页数：5
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