Automatic functional test program generation for pipelined processors using model checking

被引:11
|
作者
Mishra, P [1 ]
Dutt, N [1 ]
机构
[1] Univ Calif Irvine, Ctr Embedded Comp Syst, Irvine, CA 92717 USA
关键词
D O I
10.1109/HLDVT.2002.1224436
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Formal techniques offer an opportunity to significantly reduce the cost of microprocessor verification. We propose a model checking based approach to automatically generate functional test programs for pipelined processors. We specify the processor architecture in an Architecture Description Language (ADL). The processor model is extracted from the ADL specification. Specific properties are applied to the processor model using SMV model checker to generate test programs. We applied this methodology on a single-issue DLX processor to demonstrate the usefulness of our approach.
引用
收藏
页码:99 / 103
页数:5
相关论文
共 50 条
  • [1] Automatic test program generation for pipelined processors
    Iwashita, Hiroaki
    Kowatari, Satoshi
    Nakata, Tsuneo
    Hirose, Fumiyasu
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1994, : 580 - 583
  • [2] Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors
    Chen, Kai-Hsun
    Yang, Bo-Yi
    Liang, Jia-Ruei
    Chen, Hung-Lin
    Huang, Jiun-Lang
    2021 IEEE INTERNATIONAL TEST CONFERENCE IN ASIA (ITC-ASIA 2021), 2021,
  • [3] Graph-based functional test program generation for pipelined processors
    Mishra, P
    Dutt, N
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, 2004, : 182 - 187
  • [4] Functional test generation using property decompositions for validation of pipelined processors
    Koo, Heon-Mo
    Mishra, Prabhat
    2006 DESIGN AUTOMATION AND TEST IN EUROPE, VOLS 1-3, PROCEEDINGS, 2006, : 1240 - +
  • [5] Functional coverage driven test generation for validation of pipelined processors
    Mishra, P
    Dutt, N
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, 2005, : 678 - 683
  • [6] Automatic Test Cases Generation for C Written Programs Using Model Checking
    Gonzalez Lima, Daniset
    Gonzalez Torres, Raul E.
    Mejia Alvarez, Pedro
    2021 INTERNATIONAL CONFERENCE ON COMPUTATIONAL SCIENCE AND COMPUTATIONAL INTELLIGENCE (CSCI 2021), 2021, : 1944 - 1950
  • [7] On the functional test of the BTB logic in pipelined and superscalar processors
    Changdao, D.
    Graziano, M.
    Sanchez, E.
    Reorda, M. Sonza
    Zamboni, M.
    Zhifan, N.
    2013 14TH IEEE LATIN-AMERICAN TEST WORKSHOP (LATW2013), 2013,
  • [8] Functional Test Generation at the RTL Using Swarm Intelligence and Bounded Model Checking
    Gent, Kelson
    Hsiao, Michael S.
    2013 22ND ASIAN TEST SYMPOSIUM (ATS), 2013, : 233 - 238
  • [9] Automatic functional test program generation for microprocessor verification
    Li, Tun
    Zhu, Dan
    Liang, Lei
    Guo, Yang
    Li, SiKun
    ASP-DAC 2005: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2005, : 1039 - 1042
  • [10] Incremental test case generation using bounded model checking: an application to automatic rating
    Grzegorz Anielak
    Grzegorz Jakacki
    Sławomir Lasota
    International Journal on Software Tools for Technology Transfer, 2015, 17 : 339 - 349