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On the optical crystal properties of quantum-well GaIn(N)As/GaAs semiconductors grown by molecular-beam epitaxy
被引:7
|作者:
Pavelescu, E. -M.
Slotte, J.
Dhaka, V. D. S.
Saarinen, K.
Antohe, S.
Cimpoca, Gh.
Pessa, M.
机构:
[1] Valahia Univ, Fac Sci & Arts, Dept Phys, Targoviste, Romania
[2] Helsinki Univ Technol, Phys Lab, FIN-02015 Helsinki, Finland
[3] Tampere Univ Technol, Inst Mat Chem, FIN-33100 Tampere, Finland
[4] Univ Bucharest, Fac Phys, Bucharest 077125, Magurele, Romania
[5] Tampere Univ Technol, Optoelect Res Ctr, FIN-33100 Tampere, Finland
关键词:
photoluminescence;
point defects;
positron annihilation;
X-ray diffraction;
molecular beam epitaxy;
dilute nitrides;
D O I:
10.1016/j.jcrysgro.2006.09.012
中图分类号:
O7 [晶体学];
学科分类号:
0702 ;
070205 ;
0703 ;
080501 ;
摘要:
Photoluminescence (PL), high-precision X-ray diffraction, and positron annihilation studies were performed on compressively strained GaIn(N)As/GaAs quantum-well heterostructures in attempts to elucidate optical and structural effects originating from incorporation of nitrogen into the crystal lattice and from post-growth thermal annealing. It was found that annealing left the properties of the nitrogen-free samples rather unchanged, but strongly enhanced PL and blue-shifted the spectrum for GaInNAs/GaAs. None of the as-grown samples contained negatively charged or neutral vacancies within the sensitivity limits of the positron experiments. However, positron traps (likely Ga vacancies) appeared in the annealed GaInNAs/GaAs sample. These defects did not deteriorate strong light emission from annealed GaInNAs/GaAs. (c) 2006 Elsevier B.V. All rights reserved.
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页码:33 / 37
页数:5
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