Atomic force microscopy study of nanoporous gold surface and electrochemical properties

被引:3
|
作者
Gao, Panpan [1 ,2 ]
Qian, Ping [1 ,2 ]
Qiao, Lijie [1 ,3 ]
Volinsky, Alex A. [4 ]
Su, Yanjing [1 ,3 ]
机构
[1] Univ Sci & Technol Beijing, Beijing Adv Innovat Ctr Mat Genome Engn, Beijing 100083, Peoples R China
[2] Univ Sci & Technol Beijing, Dept Phys, Beijing 100083, Peoples R China
[3] Univ Sci & Technol Beijing, Adv Mat & Technol Inst, Beijing 100083, Peoples R China
[4] Univ S Florida, Dept Mech Engn, Tampa, FL 33620 USA
基金
中国博士后科学基金; 中国国家自然科学基金;
关键词
Nanoporous gold; Dealloying; Coarsening; Atomic force microscopy; STRAIN; FABRICATION; EVOLUTION;
D O I
10.1016/j.scriptamat.2019.03.044
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The morphology, surface oxide and strain evolution of nanoporous (np) gold were investigated using atomic force microscopy (AFM). Topographic AFM images show typical np structure with a few nanometers ligament size. Current sensing AFM results revealed semiconductor properties of the surface oxide, which may consist of Ag2O (p-type) and Ago (n-type). The surface oxide can effectively suppress the np structure coarsening. In-situ electrochemical AFM tests exhibit a refined macroscopic dimensional change of 40 nm within 0.35-0.7 V potential range. AFM can be used as an effective method to investigate the morphology and voltage-induced dimension changes in electrolyte. (C) 2019 Published by Elsevier Ltd on behalf of Acta Materialia Inc.
引用
收藏
页码:1 / 4
页数:4
相关论文
共 50 条
  • [11] Application of electrochemical atomic force microscopy
    Li, XJ
    He, PG
    Fang, YX
    Hu, J
    Li, MQ
    CHINESE JOURNAL OF ANALYTICAL CHEMISTRY, 2004, 32 (03) : 395 - 401
  • [12] Atomic Force Microscopy of Electrochemical Nanoelectrodes
    Nogala, Wojciech
    Velmurugan, Jeyavel
    Mirkin, Michael V.
    ANALYTICAL CHEMISTRY, 2012, 84 (12) : 5192 - 5197
  • [13] The use of atomic force microscopy (AFM) in the study of electrochemical phenomena
    Vermesan, Horatiu
    Hirai, Nobumitsu
    Galvanotechnik, 2010, 101 (04): : 718 - 729
  • [14] In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy
    Huang, Shiqiang
    Cheong, Ling-Zhi
    Wang, Shuwei
    Wang, Deyu
    Shen, Cai
    APPLIED SURFACE SCIENCE, 2018, 452 : 67 - 74
  • [15] Silicon surface morphology study by atomic force microscopy
    Gerasimova, O
    Boragno, C
    Borisov, S
    Valbusa, U
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2002, 9-10 : 35 - 41
  • [16] Quantitative study of surface morphology by atomic force microscopy
    Choi, Y
    Cho, NI
    Choe, JI
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2002, 16 (28-29): : 4395 - 4400
  • [17] Investigation of Surface Properties of Magnetorheological Elastomers by Atomic Force Microscopy
    Iacobescu, G. E.
    Balasoiu, M.
    Bica, I.
    JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, 2013, 26 (04) : 785 - 792
  • [18] Surface Properties of Elastomeric Polypropylenes Studied with Atomic Force Microscopy
    Dietz, C.
    Zerson, M.
    Riesch, C.
    Franke, M.
    Magerle, R.
    MACROMOLECULES, 2008, 41 (23) : 9259 - 9266
  • [19] Investigation of Surface Properties of Magnetorheological Elastomers by Atomic Force Microscopy
    G. E. Iacobescu
    M. Balasoiu
    I. Bica
    Journal of Superconductivity and Novel Magnetism, 2013, 26 : 785 - 792
  • [20] Probing Anisotropic Surface Properties of Illite by Atomic Force Microscopy
    Shao, Huaizhi
    Chang, Jing
    Lu, Zhenzhen
    Luo, Binbin
    Grundy, James S.
    Xie, Guangyuan
    Xu, Zhenghe
    Liu, Qingxia
    LANGMUIR, 2019, 35 (20) : 6532 - 6539