Functional checks of microprocessors during radiation tests

被引：13
|
作者：
Nekrasov, P. V. [1 ]
Demidov, A. A. [1 ]
Kalashnikov, O. A. [1 ]
机构：
[1] State Univ, Moscow Engn Phys Inst, Moscow 115409, Russia
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2009年 / 52卷 / 02期
关键词：
Economic and social effects - Testing;
D O I：
10.1134/S0020441209020092
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Various methods of functional checks currently used in radiation tests of microprocessors are distinguished either by extremely low information density and reliability or by an excessive time it takes to preparations and perform tests. The described method of the selective functional check is trade-off and ensures a sufficient fullness of microprocessor tests at reasonable expenses. The hardware and software base of the method is the functional check unit, which is physically, functionally, and parametrically optimized for performing radiation tests of almost all up-to-date microprocessors.
引用
收藏
页码：196 / 199
页数：4
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