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Radiative Thermal Runaway Due to Negative-Differential Thermal Emission Across a Solid-Solid Phase Transition
被引:19
|作者:
Bierman, David M.
[1
]
Lenert, Andrej
[2
]
Kats, Mikhail A.
[3
]
Zhou, You
[5
]
Zhang, Shuyan
[4
]
De La Ossa, Matthew
[1
]
Ramanathan, Shriram
[6
]
Capasso, Federico
[4
]
Wang, Evelyn N.
[1
]
机构:
[1] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
[2] Univ Michigan, Dept Chem Engn, Ann Arbor, MI 48109 USA
[3] Univ Wisconsin, Dept Elect & Comp Engn, 1415 Johnson Dr, Madison, WI 53706 USA
[4] Harvard Univ, John A Paulson Sch Engn & Appl Sci, Cambridge, MA 02139 USA
[5] Harvard Univ, Dept Chem & Chem Biol, Cambridge, MA 02138 USA
[6] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA
来源:
关键词:
THIN-FILMS;
SEMICONDUCTOR-DEVICES;
VANADIUM DIOXIDE;
VO2;
INTERFERENCE;
SPECTROSCOPY;
RECTIFIER;
D O I:
10.1103/PhysRevApplied.10.021001
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Thermal runaway occurs when a rise in system temperature results in heat-generation rates exceeding dissipation rates. Here, we demonstrate that thermal runaway occurs in radiative (photon) systems given a sufficient level of negative-differential thermal emission. By exploiting the insulator-to-metal phase transition of vanadium dioxide, we show that a small increase in heat generation (e.g., 10 nW/mm(2)) results in a large change in surface temperature (e.g., similar to 35 K), as the thermal emitter switches from high emittance to low emittance. While thermal runaway is typically associated with catastrophic failure mechanisms, detailed understanding and control of this phenomenon may give rise to new opportunities in infrared sensing, camouflage, and rectification.
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页数:6
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