Solar-Blind Ultrathin Sn-Doped Polycrystalline Ga2O3 UV Phototransistor for Normally Off Operation

被引:14
|
作者
Yoon, Youngbin [1 ]
Hwang, Wan Sik [2 ,3 ]
Shin, Myunghun [1 ]
机构
[1] Korea Aerosp Univ, Sch Elect & Informat Engn, Goyang 10540, South Korea
[2] Korea Aerosp Univ, Dept Mat Sci & Engn, Goyang 10540, South Korea
[3] Korea Aerosp Univ, Smart Drone Convergence, Goyang 10540, South Korea
来源
ADVANCED PHOTONICS RESEARCH | 2022年 / 3卷 / 05期
基金
新加坡国家研究基金会;
关键词
deep ultraviolet; beta-Ga2O3; semiconductors; phototransistors; solar blindness; ultrawide bandgap; BETA-GA2O3; THIN-FILMS; SPECTRAL-RESPONSE; PHOTODETECTOR; HETEROSTRUCTURE; HETEROJUNCTION; DEPOSITION;
D O I
10.1002/adpr.202100316
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Deep ultraviolet (DUV) photodetectors (PDs) based on ultrawide bandgap beta-Ga2O3 have great potential for aerospace, military, and civilian applications, especially because of their inherent solar blindness. An 8 nm thick Sn-doped polycrystalline beta-Ga2O3 semiconductor is used as the channel material for a solar-blind PD in this study. The beta-Ga2O3 channel is fully depleted by upward bending of the energy band owing to the work function difference between the highly p-type Si (gate electrode) and beta-Ga2O3, resulting in normally off behavior with a positive threshold voltage under dark conditions. The normally off behavior is beneficial for simplicity of the gate-driver circuitry and low power consumption under standby conditions. The fully depleted 8 nm thick polycrystalline beta-Ga2O3 exhibits high-performance DUV detection capability of light at 215 nm: a low dark current of 29.3 pA and high photo-to-dark-current ratio of approximate to 10(4) at zero gate voltage. This fully depleted n-type beta-Ga2O3 semiconductor with a wafer-scale substrate can expedite the realization of high-performance and low-power-consumption solar-blind PDs.
引用
收藏
页数:8
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