A CPW linear resonator method for the microwave characterization of high dielectric constant films

被引：5

作者：

Demenicis, Luciene S. ^{[1
]}

Lima, Rodolfo A. A.

Conrado, Luiz Fernando M.

Margulis, Walter

Carvalho, Maria Cristina R.

机构：

[1] Inst Mil Engn, Rio De Janeiro, Brazil

[2] Pontificia Univ Catolica Rio de Janeiro, Ctr Estudos Telecomun, BR-22453900 Rio De Janeiro, Brazil

[3] ACREO, Stockholm, Sweden

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2007年 / 49卷 / 03期

关键词：

very high dielectric constant; coplanar waveguide; microwave resonator; thick film;

D O I：

10.1002/mop.22176

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A coplanar waveguide linear resonator technique for the experimental characterization of the dielectric properties of films in the microwave frequency range at room temperature is proposed. The approach is simple to implement as it consists of a film with unknown high dielectric constant deposited over the resonator, printed on standard alumina substrate using conventional photolithography process. The technique is illustrated by the measurement of the dielectric constant and losses of various ceramic screen-printed thick films: BaTiO3 (BTO), CaCu3Ti4O12 (CCTO), and a BTO(x)-CCTO(1-x) composite with different concentrations (x =0.2, 0.5, and 0.8). (c) 2007 Wiley Periodicals, Inc.

引用

页码：521 / 524

页数：4

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