Suppression of span in sealed microcavity Fabry-Perot pressure sensors

被引:3
|
作者
Mishra, Shivam [1 ,2 ]
Rajappa, Balasubramaniam [1 ,2 ]
Chandra, Sudhir [3 ]
机构
[1] Homi Bhabha Natl Inst, Bombay 400094, Maharashtra, India
[2] Bhabha Atom Res Ctr, Div Precis Engn, Bombay 400085, Maharashtra, India
[3] Bennett Univ, Elect & Commun Dept, Plot 8-11,Tech Zone 2, Greater Noida 201310, Uttar Pradesh, India
关键词
extrinsic Fabry-Perot interferometer pressure sensors; Fabry-Perot interferometers; fiberoptic sensors; anodic bonding; span of pressure sensor; optical microelectromechanical system pressure sensors; deflection sensitivity; COHERENCE LIGHT-SOURCES; TO-BACK ALIGNMENT; INTERFEROMETRIC SENSORS; RECENT PROGRESS; OPTICAL-FIBER; MEMS; SILICON;
D O I
10.1117/1.OE.56.1.016105
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical microelectromechanical system pressure sensors working on the principle of extrinsic Fabry-Perot (FP) interferometer are designed and fabricated for pressure range of 1-bar absolute. Anodic bonding of silicon with glass is performed under atmospheric pressure to form FP cavity. This process results in entrapment of gas in the sealed microcavity. The effect of trapped gas is investigated on sensor characteristics. A closed-loop solution is derived for the deflection of the diaphragm of a sealed microcavity pressure sensor. Phenomenon of "suppression of span" is brought out. The sensors are tested using white light interferometry technique. The residual pressure of the trapped gas is estimated from the experiments. The developed model has been used to estimate the deflection sensitivity of the free diaphragm and the extent of suppression of span after bonding. (c) 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
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页数:9
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