Applications of atomic force microscopy to studies of environmental particles.

被引：0
|
作者：
Maurice, P
Karthikeyan, KG
Elliott, HA
Chorover, J
机构：
[1] KENT STATE UNIV,DEPT GEOL,KENT,OH 44264
[2] PENN STATE UNIV,SOIL SCI PROGRAM,UNIVERSITY PK,PA 16802
[3] PENN STATE UNIV,DEPT AGR & BIOL ENGN,UNIVERSITY PK,PA 16802
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1997年 / 214卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：29 / ENVR
页数：1
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