Ab initio molecular dynamics simulations of low energy recoil events in MgO

被引:12
|
作者
Petersen, B. A. [1 ]
Liu, B. [1 ]
Weber, W. J. [1 ,2 ]
Zhang, Y. [1 ,2 ]
机构
[1] Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA
[2] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
关键词
THRESHOLD DISPLACEMENT ENERGY; SINGLE-CRYSTAL MGO; X-RAY; PRESSURE; DEFECTS; TEMPERATURE; CERAMICS; STATE;
D O I
10.1016/j.jnucmat.2017.01.020
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Low-energy recoil events in MgO are studied using ab intio molecular dynamics simulations to reveal the dynamic displacement processes and final defect configurations. Threshold displacement energies, E-d, are obtained for Mg and O along three low-index crystallographic directions, [100], [110], and [111]. The minimum values for Ed are found along the [110] direction consisting of the same element, either Mg or 0 atoms. Minimum threshold values of 29.5 eV for Mg and 25.5 eV for O, respectively, are suggested from the calculations. For other directions, the threshold energies are considerably higher, 65.5 and 150.0 eV for O along [111] and [100], and 122.5 eV for Mg along both [111] and [100] directions, respectively. These results show that the recoil events in MgO are partial-charge transfer assisted processes where the charge transfer plays an important role. There is a similar trend found in other oxide materials, where the threshold displacement energy correlates linearly with the peak partial-charge transfer, suggesting this behavior might be universal in ceramic oxides. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:122 / 128
页数:7
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