Applications of step-scan FT-IR photoacoustic spectroscopy to thin-coatings characterization

Step-scan photoacoustic FT-IR spectroscopy has the potential to become a tremendous contributor of quick and decisive chemical characterization analyses in the area of heterogeneous coatings. One particularly challenging category of such samples involves systems having few micron-thin layered structures coated on relatively thick polymeric substrates. An example of the submicron resolution capability of the technique is demonstrated for a coated system having a submicron layer as the top layer. Step-scan FT-IR photoacoustic data are presented that show the ability to provide successful isolation of the IR signature of the top layer from the IR spectrum of the bulk material.