Electronic Devices and Circuits Based on Wafer-Scale Polycrystalline Monolayer MoS2 by Chemical Vapor Deposition

被引:78
|
作者
Wang, Lin [1 ,2 ]
Chen, Li [1 ,2 ]
Wong, Swee Liang [3 ]
Huang, Xin [1 ,2 ]
Liao, Wugang [1 ,2 ]
Zhu, Chunxiang [1 ,2 ]
Lim, Yee-Fun [3 ]
Li, Dabing [4 ]
Liu, Xinke [4 ]
Chi, Dongzhi [3 ]
Ang, Koh-Wee [1 ,2 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, 4 Engn Dr 3, Singapore 117583, Singapore
[2] Natl Univ Singapore, Ctr Adv Mat 2D, 6 Sci Dr 2, Singapore 117543, Singapore
[3] ASTAR, Inst Mat Res & Engn, 2 Fusionopolis Way, Singapore 138634, Singapore
[4] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, State Key Lab Luminescence & Applicat, Changchun 130033, Jilin, Peoples R China
来源
ADVANCED ELECTRONIC MATERIALS | 2019年 / 5卷 / 08期
基金
新加坡国家研究基金会;
关键词
chemical vapor deposition (CVD); integrated circuits; memory; MoS2; transistors; TRANSITION-METAL DICHALCOGENIDES; GRAPHENE TRANSISTORS; INTEGRATED-CIRCUITS; PHASE GROWTH; MOBILITY; LAYERS;
D O I
10.1002/aelm.201900393
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
2D layered materials such as graphene and transition-metal dichalcogenides (TMDCs) have emerged as promising candidates for next-generation nanoelectronic applications due to their atomically thin thicknesses and unique electronic properties. Among TMDCs, molybdenum disulfide (MoS2) has been extensively investigated as a channel material for field-effect transistor (FET) and circuit realization. However, to date most reported works have been limited to exfoliated MoS2 nanosheets primarily due to the difficulty in synthesizing large-area and high-quality MoS2 thin film. A demonstration of wafer-scale monolayer MoS2 synthesis is reported by chemical vapor deposition (CVD), enabling transistors, memristive memories, and integrated circuits to be realized simultaneously. Specifically, building on top-gated FETs with a high-kappa gate dielectric (HfO2), Boolean logic circuits including inverters and NAND gates are successfully demonstrated using direct-coupled FET logic technology, with typical inverters exhibiting a high voltage gain of 16, a large total noise margin of 0.72 V-DD at V-DD = 3 V, and perfect logic-level matching. Additionally, resistive switching is demonstrated in a MoS2-based memristor, indicating that they have great potential for the development of resistive random-access memory. By virtue of scalable CVD growth capability, the way toward practical and large-scale electronic applications of MoS2 is indicated.
引用
收藏
页数:10
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