Relative intensity noise characteristics of frequency stabilised grating-coupled modelocked semiconductor laser

被引：4
|
作者：
Lee, W. [1 ]
Choi, M. -T [1 ]
Izadpanah, H. [1 ]
Delfyett, R. J. [1 ]
机构：
[1] Univ Cent Florida, CREOL, Coll Opt & Photon, Orlando, FL 32816 USA
来源：
ELECTRONICS LETTERS | 2006年 / 42卷 / 20期
关键词：
D O I：
10.1049/el:20062603
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Relative intensity noise (RfN) characteristics of a frequency stabilised grating-coupled modelocked semiconductor laser (MSL) have been experimentally investigated. Reported is the first measurement, to the authors' knowledge, of general RIN characteristics as well as RIN reduction in the frequency stabilised MSL system showing the relationship between RIN and mode coherency in the MSL.
引用
收藏
页码：1156 / 1157
页数：2
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