Functional Coverage-Driven UVM-based UART IP Verification

被引:0
|
作者
Ni, Wei [1 ]
Wang, Xiaotian [1 ]
机构
[1] Hefei Univ Technol, Inst VLSI Design, Hefei 230009, Peoples R China
来源
PROCEEDINGS OF 2015 IEEE 11TH INTERNATIONAL CONFERENCE ON ASIC (ASICON) | 2015年
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
With the increased complexity of SoC caused by the rapid development of integrated circuits, verification for a SoC design also become more and more complex and occupy 70%-80% of time over the whole design process. The new UVM-based verification technology can significantly reduce the time needed. A UVM-based UART IP verification platform featuring functional coverage model is built here to find out whether the verification achieves the expected effect or not. This platform achieves 100% functional coverage with the coverage convergence method by adding test cases and using constrained random test. Simulation results show that this platform can be used to verify the UART IP and SoC featuring UART interface.
引用
收藏
页数:4
相关论文
共 50 条
  • [31] Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification
    Romero, Edgar Leonardo
    Strum, Marius
    Chau, Wang Jiang
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, 29 (02): : 223 - 236
  • [32] UVM-based verification methodology for RFID-enabled smart-sensor systems
    Muralikrishna Sathyamurthy
    Felix Neumann
    Lukasz Kotynia
    Eckhard Hennig
    Analog Integrated Circuits and Signal Processing, 2014, 78 : 191 - 207
  • [33] UVM-based verification methodology for RFID-enabled smart-sensor systems
    Sathyamurthy, Muralikrishna
    Neumann, Felix
    Kotynia, Lukasz
    Hennig, Eckhard
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2014, 78 (01) : 191 - 207
  • [34] System Verilog versus UVM-based Verification of AXI4-Lite Arbitration
    Babu, Aiswariya Ramesh
    Anand, Pooja
    Kim, Youngsoo
    SOUTHEASTCON 2023, 2023, : 350 - 357
  • [35] UVM based STBUS Verification IP for verifying SoC Architectures
    Samanta, Pranay
    Chauhan, Deepak
    Deb, Sujay
    Gupta, Piyush Kumar
    18TH INTERNATIONAL SYMPOSIUM ON VLSI DESIGN AND TEST, 2014,
  • [36] Defect Coverage-Driven Window-Based Test Compression
    Kavousianos, Xrysovalantis
    Chakrabarty, Krishnendu
    Kalligeros, Emmanouil
    Tenentes, Vasileios
    2010 19TH IEEE ASIAN TEST SYMPOSIUM (ATS 2010), 2010, : 141 - 146
  • [37] Automated UVM Based Verification of Device Life Cycle Management IP
    Kotha, Srivasthav
    Ravimony, Rajin
    Mohankumar, N.
    INTELLIGENT COMPUTING, INFORMATION AND CONTROL SYSTEMS, ICICCS 2019, 2020, 1039 : 574 - 583
  • [38] A reusable coverage-driven verification environment for Network-on-Chip communication in embedded system platforms
    Vitullo, Francesco
    Saponara, Sergio
    Petri, Esa
    Casula, Michele
    Fanucci, Luca
    Maruccia, Giuseppe
    Locatelli, Riccardo
    Coppola, Marcello
    PROCEEDINGS OF THE SEVENTH INTERNATIONAL WORKSHOP ON INTELLIGENT SOLUTIONS IN EMBEDDED SYSTEMS, 2009, : 71 - +
  • [39] A Flexible UVM-Based Verification Framework Reusable with Avalon, AHB, AXI and Wishbone Bus Interfaces for an AES Encryption Module
    Plasencia-Balabarca, Frank
    Mitacc-Meza, Edward
    Raffo-Jara, Mario
    Silva-Cardenas, Carlos
    2019 20TH IEEE LATIN AMERICAN TEST SYMPOSIUM (LATS), 2019,
  • [40] Coverage Closure Efficient UVM based Generic Verification Architecture for Flash Memory Controllers
    El-Yamany, Ahmed
    El-Ashry, Sameh
    Salah, Khaled
    2016 17TH INTERNATIONAL WORKSHOP ON MICROPROCESSOR AND SOC TEST AND VERIFICATION (MTV), 2016, : 30 - 34