High Quality SiO2-like Layers by Large Area Atmospheric Pressure Plasma Enhanced CVD: Deposition Process Studies by Surface Analysis

被引:44
|
作者
Premkumar, Peter Antony [1 ,2 ]
Starostin, Sergey A. [1 ,2 ]
de Vries, Hindrik [3 ]
Paffen, Roger M. J. [3 ]
Creatore, Mariadriana [2 ]
Eijkemans, Tom J. [4 ]
Koenraad, Paul M. [4 ]
van de Sanden, Mauritius C. M. [2 ]
机构
[1] Mat Innovat Inst, NL-2600 GA Delft, Netherlands
[2] Eindhoven Univ Technol, Plasma & Mat Proc Grp, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
[3] FUJIFILM Mfg Europe B V, Tilburg, Netherlands
[4] Eindhoven Univ Technol, Photon & Semicond Nanophys Grp, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
关键词
atmospheric pressure glow discharges (APGD); atomic force microscopy (AFM); dielectric barrier discharges (DBD); films; hexamethyldisiloxane; (HMDSO); roll-to-roll reactor; CHEMICAL-VAPOR-DEPOSITION; THIN-FILMS; BARRIER DISCHARGE; GLOW-DISCHARGE; SIOX FILMS; COATINGS; TETRAETHOXYSILANE; GROWTH; PECVD;
D O I
10.1002/ppap.200900033
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work reports on the main competing processes and their contribution to the properties of SiO2 layers on polymers in large area AP-PE-CVD from Ar-N-2-O-2-HMDSO mixtures. The detailed space resolved surface analysis on the statically deposited films showed smooth SiOx films in the vicinity of the gas injection, as deposited by HMDSO radicals. At the gas effluent, due to HMDSO depletion, non-depositing species interact with the polymer and induce rough deposits with high carbon content. The competition of plasma-polymer surface interaction with HMDSO radicals deposition, is further confirmed from the analysis of films grown on polymers with a "protecting" layer and with reverse gas flow direction. Under web roll conditions, HMDSO radicals deposition is dominant, resulting in high quality SiOx layers along the whole electrode length.
引用
收藏
页码:693 / 702
页数:10
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