Dual-frequency ECT NDT measurements by flat shape probe

被引：0
|
作者：
Daróczi, CS [1 ]
机构：
[1] Hungarian Acad Sci, Res Inst Tech Phys & Mat Sci, MTA, MFA, H-1525 Budapest 114, Hungary
来源：
APPLIED ELECTROMAGNETICS AND COMPUTATIONAL TECHNOLOGY II, PROCEEDINGS | 2000年 / 16卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A flat shape eddy current probe has been developed in order to increase the excitation depth into the investigated material via decreasing the effective distance between the sample and the probe, and in order to reduce the fabrication complexity. The fiat shape probe geometry can be effectively utilized in the case of common inductive type sensors as well as in the case of more refined fluxgate / fluxset detectors, however, it does not have to have a ferromagnetic core. In the presented work a flat shape probe was used in dual-frequency eddy current non-destructive measurement mode.
引用
收藏
页码：127 / 135
页数：9
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