Automated quality assurance for silicon microstrip sensors of the CBM Silicon Tracking System

被引：3
|
作者：
Larionov, P. [1 ]
机构：
[1] Goethe Univ Frankfurt, D-60054 Frankfurt, Germany
来源：
JOURNAL OF INSTRUMENTATION | 2016年 / 11卷
关键词：
Si microstrip and pad detectors; Particle tracking detectors (Solid-state detectors); Heavy-ion detectors;
D O I：
10.1088/1748-0221/11/01/C01033
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The Silicon Tracking System (STS) is the main tracking detector of the upcoming fixedtarget Compressed Baryonic Matter (CBM) experiment which aims to explore the phase diagram of the strongly interacting matter in a region of high net baryonic densities and moderate temperatures. The STS will be used for the reconstruction of tracks of charged particles and determination of their momenta. The system comprises 8 tracking stations located 30 cm downstream the target and will be mounted with 300 mu m thick double-sided silicon microstrip sensors in three different sizes. In this paper, the Quality Assurance (QA) procedures for the STS sensors are overviewed highlighting the automated QA testing procedure for a single strip defect identification.
引用
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页数：7
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