Structure and the mechanism of rapid phase change in amorphous Ge2Sb2Te5

被引:0
|
作者
Takata, M. [1 ]
Tanaka, Y. [1 ]
Kato, K. [1 ]
Yoshida, F. [1 ]
Fukuyama, Y. [2 ]
Yasuda, N. [2 ]
Kohara, S. [2 ]
Osawa, H. [2 ]
Nakagawa, T. [2 ]
Kim, J. [2 ]
Murayama, H. [2 ]
Kimura, S. [2 ]
Kamioka, H. [3 ]
Moritomo, Y. [3 ]
Matsunaga, T. [4 ]
Kojima, R. [4 ]
Yamada, N. [4 ]
Toriumi, K. [5 ]
Ohshima, T. [6 ]
Tanaka, H. [6 ]
机构
[1] RIKEN, SPring 8 Ctr, Sayo, Hyogo 6795148, Japan
[2] Japan Synchrotron Radiat Res Inst, SPring 8, Sayo, Hyogo 6795198, Japan
[3] Univ Tsukuba, Grad Sch Pure & Appl Sci, Tsukuba, Ibaraki 3058571, Japan
[4] Panasonic Corp, Osaka 5708501, Japan
[5] Univ Hyogo, Grad Sch Mat Sci, Kamigori, Hyogo 6781297, Japan
[6] RIKEN, XFEL Project Head Off, Sayo, Hyogo 6795148, Japan
基金
日本科学技术振兴机构;
关键词
LOCAL-STRUCTURE; CRYSTALLIZATION; BEAMLINE; DEVICES; BL04B2; FILMS;
D O I
暂无
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Understanding the mechanism of rapid phase change process in DVD (digital versatile disc) materials is one of the important topics in materials science, and hence numerous studies investigating the phase change process as well as structural analysis of the crystal and amorphous phases have been reported. Nevertheless, the mechanism of rapid phase change is still unclear, owing to the lack of detailed structure analysis, in particular oil the amorphous phase and its crystallisation process. We have studied the amorphous structure of Ge2Sb2Te5 and the crystallisation process by high energy synchrotron x-ray diffraction with the aid of structure modelling and time-resolved synchrotron x-ray diffraction, in order to obtain key information for revealing the rapid phase change mechanism. We found a large fraction of 4-fold and 6-fold rings in the atomic configuration of the amorphous phase. Intriguingly the bond angle distributions of rings exhibit a peak at approximately 90 degrees, which corresponds to that in the crystal phase. Therefore, it is suggested that the 4-fold and 6-fold rings are nuclei for crystallisation. Furthermore, time-resolved x-ray diffraction measurements combined with photoreflectivity measurements during the crystallisation of the amorphous phase suggest that the crystallisation of Ge2Sb2Te5 can be explained by a nucleation driven process. We conclude that a large amount Of nuclei is the reason for rapid crystallisation in Ge2Sb2Te5 with a nucleation driven process.
引用
收藏
页码:205 / 211
页数:7
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