The effects of mechanical properties of thin films on nano-indentation data: Finite element analysis

被引:19
|
作者
Gan, L [1 ]
BenNissan, B [1 ]
机构
[1] UNIV TECHNOL SYDNEY, DEPT MAT SCI, SYDNEY 2007, NSW, AUSTRALIA
关键词
indentation; finite element analysis; thin; films; Young's modulus; hardness; yield strength; strain hardening;
D O I
10.1016/S0927-0256(97)00040-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Mechanical properties of thin films are commonly determined using nano or ultra-microhardness indentation. Understanding the relationship of the measured data and the mechanical properties of:he indented materials is of importance in order to obtain reliable mechanical properties, particularly of the thin films. Using finite element analysis, the effects of the elastic modulus, yield strength, and strain hardening of the film on indertation data are analysed and discussed for the indentation with 2, 8, 10 and 50 mu m radius indenters. Elastic modulus of the films on a single ductile substrate shows relatively small influence whereas yield strength and strain hardening are found to have significant effect on the measured data. (C) 1997 Published by Elsevier Science B.V.
引用
收藏
页码:273 / 281
页数:9
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